Pulsed High Current Testing Applications Use Reed Relays

Introduction

When Test Equipment and Automatic Test Equipment (ATE) systems are used to test discrete semiconductors they often require a switching device that can carry high-pulsed currents that do not distort the pulsed current.  These pulsed currents are used to verify the device under test can handle high and/or surge currents without any degradation in performance.  The high current pulse verifies that the chip is adequately bonded to its substrate.  Also, at the same time, high voltages may be needed to hold off high switching voltages as well.  Using reed relays achieves the goal of billions of successful pulsed operations.

Full application write up: Pulsed High Current Testing Applications use Reed Relays

Features

• In excess of 1 billion operations including pulsed carry currents
• Small size
• Ability to carry pulsed currents up to 5 Amps
• Ability to switch up to 1000 Volts
• Dielectric strength across the contacts 3000 volts
• Round leads allow for better adherence when socketed
• Contacts dynamically tested